Keyphrases
- special issue
- automatic classification
- pattern recognition
- pattern classification
- supervised learning
- feature space
- classification models
- image classification
- text classification
- machine intelligence
- benchmark data sets
- classification algorithm
- international conference
- feature selection
- machine learning algorithms
- support vector
- object classification
- classification systems
- feature vectors
- benchmark datasets
- supervised classification
- classification process
- ai edam
- classification method
- cross validation
- data sets
- signal processing
- classification accuracy
- active learning
- artificial neural networks
- machine learning
- data mining