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A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip.

Babak AghaeiAhmad KhademzadehMidia ReshadiKambiz Badie
Published in: J. Electron. Test. (2017)
Keyphrases
  • communication channels
  • network on chip
  • built in self test
  • multi processor
  • parallel processing
  • routing algorithm
  • real time
  • wireless networks