Login / Signup

Thermal Aware Global Routing of VLSI Chips for Enhanced Reliability.

Aseem GuptaNikil D. DuttFadi J. KurdahiKamal S. KhouriMagdy S. Abadir
Published in: ISQED (2008)
Keyphrases
  • high speed
  • infrared
  • power plant
  • routing algorithm
  • integrated circuit
  • global information
  • highly reliable
  • real time
  • genetic algorithm
  • information systems
  • wireless ad hoc networks
  • vlsi design
  • inter domain
  • chip design