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Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1µm n-MOSFET.

F. M. BuflerAndreas SchenkChristoph ZechnerNatsuko InadaYoshinori AsahiWolfgang Fichtner
Published in: VLSI Design (2002)
Keyphrases
  • monte carlo simulation
  • monte carlo
  • markov chain
  • statistical analysis
  • databases
  • neural network
  • machine learning
  • artificial intelligence
  • knowledge base
  • artificial neural networks