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Impact of Gate Offset on PBTI of p-GaN Gate HEMTs.
Ethan S. Lee
Jungwoo Joh
Dong-Seup Lee
Jesús A. del Alamo
Published in:
IRPS (2022)
Keyphrases
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pattern recognition
nano scale
databases
real time
feature selection
case study
multiscale
expert systems
efficient implementation