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AFM studies of polyaniline nanofilms irradiated with gamma rays.

Jane M. G. LaranjeiraEronides Felisberto da Silva JúniorWalter M. de AzevedoElder A. de VasconcelosHelen J. KhouryR. A. SimãoC. A. Achete
Published in: Microelectron. J. (2003)
Keyphrases
  • empirical studies
  • expert systems
  • real time
  • real world
  • learning algorithm
  • wide range
  • probabilistic model
  • atomic force microscopy