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A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives.

Kuan-Yu LiaoChia-Yuan ChangJames Chien-Mo Li
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • generation algorithm
  • high quality
  • e learning
  • multiscale
  • multi objective
  • pattern matching
  • parallel processing
  • quality measures
  • pattern languages