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Recursive-CPLS-Based Quality-Relevant and Process-Relevant Fault Monitoring With Application to the Tennessee Eastman Process.

Changhua HuZhongying XuXiangyu KongJiayu Luo
Published in: IEEE Access (2019)
Keyphrases
  • databases
  • process model
  • chemical process
  • machine learning
  • rough sets
  • source code
  • business process