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A 1.6V 1.4Gb/s/pin consumer DRAM with self-dynamic voltage-scaling technique in 44nm CMOS technology.

Hyun-Woo LeeKi-Han KimYoung-Kyoung ChoiJu-Hwan ShonNak-Kyu ParkKwan-Weon KimChulwoo KimYoung-Jung ChoiByong-Tae Chung
Published in: ISSCC (2011)
Keyphrases
  • low voltage
  • cmos technology
  • low power
  • high speed
  • power consumption
  • spl times
  • parallel processing
  • random access memory
  • data structure
  • image formation
  • mixed signal
  • embedded dram
  • high resolution
  • signal processing