Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips.
Sandeep Kumar GoelBart VermeulenPublished in: J. Electron. Test. (2003)
Keyphrases
- data analysis
- data sets
- data collection
- statistical analysis
- data processing
- high quality
- raw data
- computer systems
- database
- knowledge discovery
- data distribution
- data quality
- high dimensional data
- sensor data
- response time
- data sources
- mobile devices
- website
- missing data
- training data
- multiple sources
- correlation analysis