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High performance high reliability AlN/GaN DHFET.
F. Medjdoub
E. Okada
Bertrand Grimbert
D. Ducatteau
Riccardo Silvestri
Matteo Meneghini
Enrico Zanoni
Gaudenzio Meneghesso
Published in:
ESSDERC (2014)
Keyphrases
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high reliability
high precision
low cost
low overhead
remote control
structuring elements
real time
databases
computer conferencing
database
learning resources
fine grained
gray scale
color images
multiscale
information systems
machine learning
real world