Login / Signup
Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology.
Benjamin Willsch
Marius te Heesen
Julia Hauser
Stefan Dreiner
Holger Kappert
Holger Vogt
Published in:
DTIS (2018)
Keyphrases
</>
high temperature
cmos technology
low power
power consumption
low voltage
silicon on insulator
neural network
low cost
input output