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Mechanical Modulation of Phonon-Assisted Field Emission in a Silicon Nanomembrane Detector for Time-of-Flight Mass Spectrometry.
Jonghoo Park
Robert H. Blick
Published in:
Sensors (2016)
Keyphrases
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time of flight
mass spectrometry
high throughput
depth map
depth information
infrared
mass spectra
high accuracy
range data
high resolution
depth images
spectral data
spatial resolution
stereo vision
ccd camera
high speed
data sets
viewpoint
real scenes
image processing
machine learning