A novel analytical method for defect tolerance assessment.
Mariem SlimaniArwa Ben DhiaLirida A. B. NavinerPublished in: Microelectron. Reliab. (2015)
Keyphrases
- high precision
- detection method
- synthetic data
- preprocessing
- significant improvement
- computational cost
- computer vision
- main contribution
- computationally efficient
- high accuracy
- experimental evaluation
- prior knowledge
- similarity measure
- decision trees
- denoising
- dynamic programming
- theoretical analysis
- detection algorithm
- clustering method
- mathematical model
- statistical model
- data sets
- optimization method