Applying Universal Chip Telemetry to Detect Latent Defects and Aging in Advanced Electronics.

Evelyn Landman Alex Burlak C. Nir Sever Marc Hutner

Published in: IRPS (2022)

Keyphrases

automatic detection
analog vlsi
high speed
defect detection
low cost
database
image processing
detection algorithm
detection method
data sets
latent variables