Optical characterization of integrated P+/N-Well/P-substrate and N-Well/P-substrate photo-device structures on CMOS technology.
Gelacio Castillo-CabreraJ. Garcia-LamontMario Alfredo Reyes-BarrancaJose Antonio Moreno-CadenasA. Escobosa-EchavarriaPublished in: CCE (2010)