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Overview of Special Issue.

James AllanNicholas J. BelkinPaul N. BennettJamie CallanCharles L. A. ClarkeFernando DiazSusan T. DumaisNicola FerroDonna HarmanDjoerd HiemstraIan RuthvenTetsuya SakaiMark D. SmuckerJustin Zobel
Published in: SIGIR Forum (2017)
Keyphrases
  • special issue
  • international journal
  • ai edam
  • ecml pkdd
  • applied intelligence
  • special section
  • domain knowledge
  • future trends
  • machine learning
  • e learning