Testability analysis and multi-frequency ATPG for analog circuits and systems.

Sam D. Huynh Seongwon Kim Mani Soma Jinyan Zhang

Published in: ICCAD (1998)

Keyphrases

analog circuits
neural network
machine learning
expert systems
computer systems
statistical analysis
learning systems
digital circuits
real time
data sets
relational databases
knowledge representation
management system
building blocks
embedded systems