Login / Signup
Equivalence Proofs of Some Yield Modeling Methods for Defect-Tolerant Integrated Circuits.
Claude Thibeault
Yvon Savaria
Jean-Louis Houle
Published in:
IEEE Trans. Computers (1995)
Keyphrases
</>
integrated circuit
significant improvement
computational cost
computationally expensive
database
preprocessing
high dimensional data
statistical models
information retrieval
social networks
feature space
machine learning methods
efficient implementation
theorem proving