Acoustic Microscopy Technique to Precisely Locate Layer Delamination.

Stefan J. Rupitsch Bernhard G. Zagar

Published in: IEEE Trans. Instrum. Meas. (2007)

Keyphrases

source localization
image analysis
electron microscopy
multi layer
high throughput
high resolution
image stacks
stereo imaging
microscopy images
application layer
three dimensional
x ray
database
case study
information systems
machine learning
neural network
databases
real time