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Control of Wafer Scanners: Methods and Developments.
Marcel François Heertjes
Hans Butler
N. J. Dirkx
S. H. van der Meulen
R. Ahlawat
K. O'Brien
J. Simonelli
K.-T. Teng
Y. Zhao
Published in:
ACC (2020)
Keyphrases
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computer vision
machine learning methods
control problems
benchmark datasets
preprocessing
significant improvement
computationally expensive
real time
real world
learning algorithm
face recognition
search algorithm
evolutionary algorithm
data mining techniques
cross validation
image reconstruction