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Functional and catastrophic thermal failures in bipolar electronic circuits.

Krzysztof GóreckiWitold J. StepowiczJanusz Zarebski
Published in: ICECS (2005)
Keyphrases
  • electronic circuits
  • parallel processing
  • infrared
  • positive and negative
  • graduate school
  • information retrieval
  • mathematical model
  • neural network
  • failure rate
  • functional analysis
  • failure detection
  • injection lasers