Login / Signup
Static noise analysis for digital integrated circuits in partially depleted silicon-on-insulator technology.
Steven C. Chan
Kenneth L. Shepard
Dae-Jin Kim
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
</>
integrated circuit
computer systems
image processing
cost effective
data flow
electron beam
metal oxide semiconductor