Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities.

Published in: Microelectron. Reliab. (2012)

Keyphrases

signal to noise ratio
noisy data
noise reduction
noise level
image noise
adverse effect
gaussian noise
noise free
uniformly distributed
bias variance
measurement error
low signal to noise ratio
stochastic programming
random noise
noisy environments
trade off
noise removal
boundary conditions
missing data
denoising