Login / Signup
Antecedent hash modality learning and representation for enhanced wafer map defect pattern recognition.
Minghao Piao
Cheng Hao Jin
Baojiang Zhong
Published in:
Expert Syst. Appl. (2024)
Keyphrases
</>
pattern recognition
learning algorithm
reinforcement learning
learning process
neural network
machine learning
unsupervised learning
learning systems
multiscale
prior knowledge
supervised learning
learning tasks
image processing
feature space
massively parallel
defect detection