A 0.2-11.7GHz, high accuracy injection-locking multi-phase generation with mixed analog/digital calibration loops in 28nm FDSOI CMOS.
Gabriele AnzaloneEnrico MonacoGuido AlbasiniSimone ErbaAndrea MazzantiPublished in: ESSCIRC (2016)
Keyphrases
- circuit design
- mixed signal
- high accuracy
- cmos image sensor
- cmos technology
- low power
- analog vlsi
- high speed
- analog to digital converter
- metal oxide semiconductor
- multi channel
- power consumption
- delta sigma
- dynamic range
- digital circuits
- camera calibration
- low cost
- focal plane
- image sensor
- nm technology
- silicon on insulator
- real time
- concurrency control
- frequency modulation
- infrared
- data conversion
- parallel processing
- frequency band
- power reduction
- low voltage
- data objects
- solid state
- signal processing
- single chip
- high resolution
- calibration method