A Model for T-Way Fault Profile Evolution during Testing.
D. Richard KuhnRaghu N. KackerYu LeiPublished in: ICST Workshops (2017)
Keyphrases
- probabilistic model
- mathematical model
- management system
- computational model
- experimental data
- objective function
- expert systems
- formal model
- process model
- hierarchical structure
- prediction model
- neural network
- neural network model
- conceptual model
- test data
- statistical model
- software systems
- least squares
- cost function
- training data