reconfigurable sensor-ADC using 4CKES-TAD in 65nm digital CMOS.
Takamoto WatanabeYu HouMasaya MiyaharaAkira MatsuzawaPublished in: ICECS (2014)
Keyphrases
- analog to digital converter
- cmos image sensor
- metal oxide semiconductor
- image sensor
- low cost
- mixed signal
- single chip
- cmos technology
- low power
- dynamic range
- circuit design
- general purpose
- parallel processing
- reconfigurable architecture
- real time
- data acquisition
- high dynamic range
- power consumption
- silicon on insulator