Login / Signup
Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices.
A. Kerlain
V. Mosser
Published in:
Microelectron. Reliab. (2005)
Keyphrases
</>
low frequency
high frequency
quality control
wavelet analysis
wavelet transform
multiscale
frequency domain
frequency band
denoising
image compression
electromagnetic fields