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Transparent-Test Methodologies for Random Access Memories Without/With ECC.

Jin-Fu Li
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
  • random access
  • memory size
  • multiview video coding
  • disk storage
  • solid state
  • flash memory
  • low complexity
  • associative memory
  • hard disk