A Noninvasive and Robust Diagnostic Method for Open-Circuit Faults of Three-Level Inverters.
Xun WuTefang ChenShu ChengTianjian YuChaoqun XiangKaidi LiPublished in: IEEE Access (2019)
Keyphrases
- synthetic data
- computationally efficient
- preprocessing
- pairwise
- prior knowledge
- significant improvement
- detection method
- high accuracy
- segmentation method
- high precision
- dynamic programming
- cost function
- fully automatic
- multiscale
- probabilistic model
- highly accurate
- image noise
- feature set
- support vector machine
- data sets
- experimental evaluation
- computational complexity
- objective function
- genetic algorithm