Login / Signup

Investigations of photo-assisted conductive atomic force microscopy on III-nitrides.

Mao-Nan ChangRuo-Syuan LinHsueh-Hsing LiuHung-Min LinHung-Cheng LinJen-Inn Chyi
Published in: Microelectron. J. (2009)
Keyphrases
  • atomic force microscopy
  • high quality
  • database
  • information retrieval
  • search engine
  • computer vision
  • image processing
  • decision trees
  • three dimensional
  • high level
  • face recognition