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Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology.

Sujay PandeySanya GuptaMadhu Sudhan L.Suriya NatarajanArani SinhaAbhijit Chatterjee
Published in: ITC (2019)
Keyphrases
  • qualitative and quantitative
  • high speed
  • information retrieval
  • multiscale
  • environmental factors
  • analog vlsi