Login / Signup
On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology.
Benjamin Viale
M. Fer
L. Courau
Philippe Galy
Bruno Allard
Published in:
Microelectron. Reliab. (2016)
Keyphrases
</>
silicon on insulator
genetic algorithm
data processing
cost effective
model checking
artificial intelligence
web services
high speed
infrared
key technologies