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Quasi-repetitive control for fast and accurate atomic force microscopy.

Muthukumaran LoganathanDouglas A. Bristow
Published in: ACC (2016)
Keyphrases
  • atomic force microscopy
  • control system
  • databases
  • neural network
  • probabilistic model
  • database
  • data sets
  • social networks
  • case study
  • cooperative
  • sufficient conditions
  • optimal control
  • accurate estimation