A universal MOSFET mobility degradation model for circuit simulation.
Gregory Munson YericA. F. Tasch Jr.Sanjay K. BanerjeePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
- simulation model
- probabilistic model
- probability distribution
- neural network model
- neural network
- statistical model
- prediction model
- formal model
- management system
- computational model
- mathematical model
- parameter estimation
- simulation models
- conceptual model
- theoretical analysis
- cost function
- high level
- learning algorithm
- genetic algorithm