Pattern-based identification for process control applications.

Kar-Ann Toh Rajagopalan Devanathan

Published in: IEEE Trans. Control. Syst. Technol. (1996)

Keyphrases

process control
control system
intelligent control
product quality
manufacturing process
person identification
real time
machine learning
automatic identification
database
information systems
information retrieval
knowledge base
image sequences
search algorithm
semiconductor manufacturing