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Algorithmic iterative sampling in coordinate metrology plan for coordinate metrology using dynamic uncertainty analysis.

Thiago de Castro MartinsMarcos de Sales Guerra TsuzukiRogerio Y. TakimotoAhmad BarariGiulliano B. GalloMarcos A. A. GarciaHamilton Tiba
Published in: INDIN (2014)
Keyphrases
  • dynamic environments
  • quantitative analysis
  • database systems
  • image analysis
  • random sampling
  • process control
  • camera calibration
  • single view