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Comparing distortion and power characteristics of AlGaN/GaN HEMTs between SiC and GaN substrates.

Atsushi MoriwakiShinji Hara
Published in: IEICE Electron. Express (2022)
Keyphrases
  • structuring elements
  • power consumption
  • data sets
  • image analysis
  • binary images
  • multi layer
  • high density