Statistical Modeling of Read Static Noise Margin for 6-Transistor SRAM cell.
Byeong-Jun BangHyun-jeong KwonYoung Hwan KimKyoung-Rok ChoHi-Seok KimPublished in: ISCAS (2019)
Keyphrases
- statistical modeling
- statistical models
- low power
- predictive modeling
- high speed
- signal to noise ratio
- noise level
- support vector
- training set
- power consumption
- noisy data
- random noise
- objective function
- missing data
- computer vision
- noise reduction
- low cost
- median filter
- maximum margin
- noise model
- moving objects
- data mining
- leakage current
- nonparametric bayesian