Login / Signup

The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology.

Basel HalakVasileios TenentesDaniele Rossi
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • nano scale
  • cmos technology
  • low power
  • low voltage
  • spl times
  • software aging
  • power consumption
  • real time
  • vision system