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Post-silicon patching for verification/debugging with high-level models and programmable logic.

Masahiro FujitaHiroaki Yoshida
Published in: ASP-DAC (2012)
Keyphrases
  • high level
  • programmable logic
  • low level
  • cooperative
  • probabilistic model
  • image processing
  • general purpose
  • higher order
  • low cost
  • high speed
  • model selection
  • complex systems
  • statistical models