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Leakage current reduction by new technique in standby mode.

Amir AmirabadiJavid JaffariAli Afzali-KushaMehrdad NouraniAli Khaki-Firooz
Published in: ACM Great Lakes Symposium on VLSI (2004)
Keyphrases
  • leakage current
  • real time
  • e learning
  • pattern recognition
  • image formation
  • power line