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The impact of GATE thickness variation on FinFET performance parameters.

Dhananjaya TripathyDebiprasad Priyabrata AcharyaPrakash Kumar RoutDebasish Nayak
Published in: OCIT (2021)
Keyphrases
  • parameter values
  • skin surface
  • database
  • information technology
  • maximum likelihood
  • parameter settings
  • high impact
  • maximum likelihood estimation
  • input parameters
  • cross section