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Novel Opto-Electronical Probe Card for Wafer-Level PIC Testing.
Tobias Gnausch
Armin Grundmann
Thomas Juhasz
Thomas Kaden
Robert Buttner
Thilo von Freyhold
Published in:
OFC (2019)
Keyphrases
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low cost
higher level
data mining
test cases
integrated circuit
database
real world
information systems
metadata
case study
three dimensional
test set
fine grained
smart card