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Self-Supervised Learning in Electron Microscopy: Towards a Foundation Model for Advanced Image Analysis.
Bashir Kazimi
Karina Ruzaeva
Stefan Sandfeld
Published in:
CoRR (2024)
Keyphrases
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image analysis
learning scheme
objective function
prior knowledge
mathematical model
learning phase
learning models
probabilistic model
computational model
three dimensional
electron microscopy
high level
x ray
probability distribution
theoretical foundation
pattern recognition
similarity measure
machine learning