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Effect of conductive filament morphology on soft error of oxide based Resistive Random Access Memory.
Xu Zheng
Jie Yu
Wenxuan Sun
Jinru Lai
Danian Dong
Guozhong Xing
Xiaoxin Xu
Published in:
ICTA (2021)
Keyphrases
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random access memory
low voltage
leakage current
design considerations