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μA/μm, DIBL =44mV/V, Positive VT, and Process Temp. of 300 °C.

Jih-Chao ChiuEknath SarkarYuan-Ming LiuYu-Ciao ChenYu-Cheng FanC. W. Liu
Published in: VLSI Technology and Circuits (2023)
Keyphrases
  • three dimensional
  • learning environment
  • information technology
  • probabilistic model