C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
A gate-delay model focusing on current fluctuation over wide range of process-voltage-temperature variations.
Kenichi Shinkai
Masanori Hashimoto
Takao Onoye
Published in:
Integr. (2013)
Keyphrases
</>
wide range
probabilistic model
high level
prior knowledge
metamodel
neural network
statistical model
experimental data
conceptual model
recognition process
web services
theoretical analysis
network structure
simulation model
diffusion process