Trace Ratio vs. Ratio Trace for Dimensionality Reduction.

Huan Wang Shuicheng Yan Dong Xu Xiaoou Tang Thomas S. Huang

Published in: CVPR (2007)

Keyphrases

dimensionality reduction
pattern recognition
real world
database systems
standard deviation
structure preserving
database
neural network
data mining
feature extraction
artificial neural networks
source code
high dimensional data
failure rate